EPJ Web of Conferences 6, 26008 (2010)
https://doi.org/10.1051/epjconf/20100626008

X-ray strain analysis in thin films enhanced by 2D detection

¹ Institut P’ CNRS - Université de Poitiers - ENSMA, UPR3346, 86962 Futuroscope, France
² LPMTM, UPR9001 CNRS, Université Paris13, 93430 Villetaneuse, France
³ PIMM, ENSAM, 151 Bd de l'Hopital, 75013 Paris, France

^a e-mail : faurie@univ-paris13.fr

Abstract

Performing a complete in-situ strain measurement of polycrystalline thin films using X-ray diffraction is time consuming with most standard diffraction beamlines at synchrotron facilities and not realistic with laboratory diffractometers. Two dimensional detection is shown to enable relatively fast and reliable X-ray strain measurements during continuous in-situ tensile testing of metallic films deposited on polyimide substrates. We show in this paper the advantages to perform this kind of measurements as compared to those with punctual detection.