https://doi.org/10.1051/epjconf/20100626008
X-ray strain analysis in thin films enhanced by 2D detection
1
Institut P’ CNRS - Université de Poitiers - ENSMA,
UPR3346, 86962
Futuroscope,
France
2
LPMTM, UPR9001 CNRS, Université Paris13,
93430
Villetaneuse,
France
3
PIMM, ENSAM, 151 Bd de l'Hopital,
75013
Paris,
France
a e-mail : faurie@univ-paris13.fr
Performing a complete in-situ strain measurement of polycrystalline thin films using X-ray diffraction is time consuming with most standard diffraction beamlines at synchrotron facilities and not realistic with laboratory diffractometers. Two dimensional detection is shown to enable relatively fast and reliable X-ray strain measurements during continuous in-situ tensile testing of metallic films deposited on polyimide substrates. We show in this paper the advantages to perform this kind of measurements as compared to those with punctual detection.
© Owned by the authors, published by EDP Sciences, 2010
