https://doi.org/10.1051/epjconf/20100630003
Investigation of crack origin in hybrid components with twocolor digital Fresnel holography
1
LAUM CNRS, Université du Maine, Avenue Olivier Messiaen,
72085 LE MANS Cedex
9, France
2
École Nationale Supérieure d’Ingénieurs du Mans,
rue Aristote,
72085
Le Mans Cedex 9,
France
3
LPEC CNRS, Université du Maine, Avenue Olivier Messiaen,
72085
LE MANS Cedex 9,
France
4
VALEO, 45
rue Charles de Coulomb, 14125
Mondeville Cedex,
France
a e-mail: patrice.tankam.etu@univ-lemans.fr
The paper presents a two-color digital holographic interferometer. The set-up is devoted to the investigation of crack origin in hybrid industrial electronic components. Optical configuration and algorithms to recover the optical phase of two-color digitally encoded holograms are described. The method is based on a spatial-color-multiplexing scheme in which holographic reconstruction is performed using a spectral scanning algorithm. Experimental results exhibit in-plane and out-of-plane non uniform deformations that are the probable cause of the cracking of the component.
© Owned by the authors, published by EDP Sciences, 2010
