https://doi.org/10.1051/epjconf/20111502007
Local Structure of Superionic Glass Agx(GeSe3)1-x, x=0.565
1
Department of Physics, Graduate School of Sciences, Kyushu University, Hakozaki, Higashi-ku, Fukuoka 812-8581, Japan
2
Research and Utilization Division, Japan Synchrotron Radiation Research Institute (JASRI, Spring-8), 1-1-1 Koto, Sayocho, Sayo-gun, Hyogo 679-5198, Japan
3
J-PARC, Japan Atomic Energy Agency, 2-4 Shirakata Shirane, Tokai, Naka, Ibaraki 319-1195, Japan
4
Research Institute for Solid State Physics and Optics, Hungarian Academy of Sciences, H-1525 Budapest, P.O.B. 49, Hungary
5
Department of Physics, Faculty of Sciences, Kyushu University, 6-10-1 Hakozaki, Higashi-ku, Fukuoka 812-8581, Japan
6
Beamline Department, Pohang Accelerator Laboratory, Pohang University of Science and Technology, San31, Hyoja– doing, Pohang, 790-784, Korea
7
Laboratoire Léon Brillouin, CEA/Saclay, 91191 Gif-Sur-Yvette Cedex, France
To investigate relation between inhomogeneous structure of Agx(GeSe3)1-x superionic glass and conduction path formation, x-ray diffraction, neutron diffraction and EXAFS measurements on K-edges for each constituent were performed. Reverse Monte Carlo structural modelling based on these experimental data revealed that Ag conduction paths are formed in random glass media of GeSe4 tetrahedral network. The first sharp diffraction peak (FSDP) located at 1.1 Å-1 is mainly contributed by GeSe4 network, while an observed intense small angle scattering is contributed also by Ag-Ag as well as GeSe4 network.
© Owned by the authors, published by EDP Sciences, 2011