Neutron and charged particle identification by means of various detectors

M. Sénoville; N.L. Achouri; F. Delaunay; J. Gibelin; B. Laurent; X. Ledoux; F.M. Marqués; N.A. Orr; C. Fontbonne; B. Carniol; T. Chaventré; D. Cussol; D. Etasse; J.M. Fontbonne; J. Harang; J. Hommet; H. Plard; J. Poincheval; O. Lopez; N. Le Neindre; B. Borderie; M.F. Rivet; L. Tassan-Got; P. Pawłowski; G. Tăbăcaru; A. Brauning-Demian; J. Perronnel; E. Balanzat; H. Hamrita; G. Randisi; D. Dumitriu; D. Flueraşu; Y. Thimont; M. Pârlog

doi:10.1051/epjconf/20123100028

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Proceedings

Open Access

EPJ Web of Conferences 31, 00028 (2012)
https://doi.org/10.1051/epjconf/20123100028

Neutron and charged particle identification by means of various detectors

M. Sénoville¹, N.L. Achouri¹, F. Delaunay¹, J. Gibelin¹, B. Laurent², X. Ledoux², F.M. Marqués¹, N.A. Orr¹, C. Fontbonne¹, B. Carniol¹, T. Chaventré¹, D. Cussol¹, D. Etasse¹, J.M. Fontbonne¹, J. Harang¹, J. Hommet¹, H. Plard¹, J. Poincheval¹, O. Lopez¹, N. Le Neindre¹, B. Borderie³, M.F. Rivet³, L. Tassan-Got³, P. Pawłowski⁴, G. Tăbăcaru⁵, A. Brauning-Demian⁶, J. Perronnel¹, E. Balanzat⁷, H. Hamrita⁷, G. Randisi¹, D. Dumitriu⁹, D. Flueraşu⁹, Y. Thimont¹⁰, M. Pârlog¹^,9 and the INDRA and FAZIA Collaborations

¹ LPC, ENSICAEN, Université de Caen, CNRS/IN2P3, Caen, France
² CEA, DAM, DIF, 91297 Arpajon, France
³ Institut de Physique Nucléaire, CNRS/IN2P3,Université Paris-Sud 11, F-91406 Orsay Cedex, France
⁴ Insitute of Nuclear Physics PAN, Kraków, Poland
⁵ Texas A&M University, Cyclotron Institute, College Station, TX, USA
⁶ Helmholtzzentrum für Schwerionenforschung, Darmstadt, Germany
⁷ CIMAP, ENSICAEN, CEA-CNRS/IN2P3, Caen, France
⁸ CEA, LIST, LCAE, F-91191 Gif-sur-Yvette Cedex, France
⁹ National Institute for Physics and Nuclear Engineering, RO-077125 Bucharest-Măgurele, Romania
¹⁰ CRISMAT, ENSICAEN, CNRS/IN2P3, Caen, France

Abstract

Identification methods for photons, neutrons and heavy ions by using scintillator and semiconductor detectors are discussed by stressing the advantages of signal digitization.

© Owned by the authors, published by EDP Sciences - SIF, 2012