https://doi.org/10.1051/epjconf/20134103014
Time and momentum resolved resonant magnetic x-ray diffraction on EuTe
1 Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Albert-Einstein Str. 15, Berlin, Germany
2 II. Physikalisches Institut, Universität zu Köln, Zülpicher Str.77 Köln, Germany
3 Institut für Halbleiterphysik, Johannes Kepler Universität, Linz, Austria
We used fs- and ps- resonant magnetic x-ray diffraction to probe the laser-induced changes to the magnetic profile in thin films of the antiferromagnetic semicon-ductor EuTe.
© Owned by the authors, published by EDP Sciences, 2013
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