EPJ Web of Conferences 41, 08016 (2013)
https://doi.org/10.1051/epjconf/20134108016
https://doi.org/10.1051/epjconf/20134108016
Time Domain Characterization of Light Trapping States in Thin Film Solar Cells
1 Fakultät für Physik, Universität Bielefeld, 33615 Bielefeld, Germany
2 Malibu GmbH & Co. KG, Böttcherstr.7, 33609 Bielefeld, Germany
a e-mail: pfeiffer@physik.uni-bielefeld.de
Spectral interferometry of the backscattered radiation reveals coherence lifetimes of about 150 fs for nanolocalized electromagnetic modes in textured layered nanostructures as they are commonly used in thin film photovoltaics to achieve high cell efficiencies.
© Owned by the authors, published by EDP Sciences, 2013
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 2.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
