Time Domain Characterization of Light Trapping States in Thin Film Solar Cells
1 Fakultät für Physik, Universität Bielefeld, 33615 Bielefeld, Germany
2 Malibu GmbH & Co. KG, Böttcherstr.7, 33609 Bielefeld, Germany
a e-mail: email@example.com
Spectral interferometry of the backscattered radiation reveals coherence lifetimes of about 150 fs for nanolocalized electromagnetic modes in textured layered nanostructures as they are commonly used in thin film photovoltaics to achieve high cell efficiencies.
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