Effect of the annealing temperature on dynamic and structural properties of Co2FeAl thin films
1 LSPM (CNRS-UPR 3407), Université Paris 13, 99 avenue Jean-Baptiste Clément, 93430 Villetaneuse, France
2 Centre for Superconductivity, Spintronics and Surface Science, Technical University of Cluj-Napoca, Str. Memorandumului No. 28 RO-400114 Cluj-Napoca, ROMANIA Sciences
3 Institut Jean Lamour, CNRS, Université de Nancy, BP 70239, F– 54506 Vandoeuvre, France
a Corresponding author: firstname.lastname@example.org
Published online: 3 July 2014
10 nm and 50 nm thick Co2FeAl (CFA) thin films have been deposited on thermally oxidized Si(001) substrates by magnetron sputtering using a Tantalum cap layer and were then ex-situ annealed at 415°C, 515°C and 615°C during 15 minutes in vacuum. X-rays diffraction indicates that films CFA are polycrystalline and exhibit an in-plane isotropy growth. Ferromagnetic resonance measurements, using a microstrip line (MS-FMR), reveal a huge interfacial perpendicular magnetic anisotropy and small in-plane uniaxial anisotropy both annealing temperature-dependent. The MS-FMR data also allow concluding that the gyromagnetic factor remains constant and that the exchange stiffness constant increases with annealing temperature. Finally, the FMR linewidth decreases with increasing annealing temperature due to the enhancement of the chemical order, and allow deriving a very low intrinsic damping parameter (1.3×10−3 at 615°C).
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