Focused Kerr measurements on patterned arrays of exchange biased square dots
1 SPINTEC, CEA/CNRS/UJF/Grenoble-INP; CEA/INAC, 17, rue des Martyrs, 38054, Grenoble, France
2 Crocus Technology, 4 Robert Schuman, 38025 Grenoble, France
3 Institut Néel, CNRS and UJF, BP166, 38042 Grenoble, France
Published online: 3 July 2014
Microstructural effects on the antiferromagnetic layer were investigated on IrMn/Co exchange biased square dots. IrMn grain size and distributions were tuned by changing Cu buffer layer or IrMn thicknesses. Lateral dimensions from 200 to 50nm were varied. Exchange bias (Hex) variability was analysed through focused Kerr measurements on small groups of dots. Patterned samples presented average exchange bias values following the trends and values of full sheet samples. Concerning the dot to dot behaviour, it resulted that IrMn microstructure variations have minor effects on Hex variability, because no particular trend is observed as a function of grain size and distribution. The variability is attributed to geometry variation and Co intrinsic variability.
© Owned by the authors, published by EDP Sciences, 2014
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 2.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.