Ultrafast Degenerate Transient Lens Spectroscopy in Semiconductor Nanosctructures

A.V. Leontyev; D.K. Zharkov; A.G. Shmelev; V.G. Nikiforov; V.S. Lobkov

doi:10.1051/epjconf/201510307002

EPJ

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Proceedings

Open Access

EPJ Web of Conferences 103, 07002 (2015)
https://doi.org/10.1051/epjconf/201510307002

Ultrafast Degenerate Transient Lens Spectroscopy in Semiconductor Nanosctructures

A.V. Leontyev^a, D.K. Zharkov, A.G. Shmelev, V.G. Nikiforov and V.S. Lobkov

Kazan E. K. Zavoisky Physical -Technical Institute Sibirsky tract, 10/7 420029 Kazan, Russia

^a Corresponding author: mailscrew@gmail.com

Published online: 25 September 2015

Abstract

We report the non-resonant excitation and probing of the nonlinear refractive index change in bulk semiconductors and semiconductor quantum dots through degenerate transient lens spectroscopy. The signal oscillates at the center laser field frequency, and the envelope of the former in quantum dots is distinctly different from the one in bulk sample. We discuss the applicability of this technique for polarization state probing in semiconductor media with femtosecond temporal resolution.

Key words: transient lens / quantum dots / nanocomposites / transient polarization

© Owned by the authors, published by EDP Sciences, 2015

This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.