https://doi.org/10.1051/epjconf/201713301003
Growth and characterization of organic layers deposited on porous-patterned Si surface
1 V.Lashkarev Institute of Semiconductors Physics, NAS of Ukraine, 45, Prospekt Nauki, 03028, Kyiv, Ukraine
2 Chair of Experimental Physics, Faculty of Mathematics and Natural Sciences , University of Rzeszow, S. Pigonia 1, 35-959 Rzeszow, Poland
Published online: 15 December 2016
The organic layers with the thickness from a few nanometers up to few micrometers have been deposited from the chemical solution at room temperature on porous patterned Si surfaces using two medical solutions: thiamine diphosphide (pH=1÷2) and metamizole sodium (pH=6÷7). Based on evolution of morphology, structural and compositional features obtained by scanning electron microscopy, X-ray analysis, reflectance high energy electron diffraction the grown mechanisms in thin organic layers are discussed in the terms of terrace-step-kink model whereas self-organized assemblies evaluated more thick layers. Transport mechanism features and possible photovoltaic properties are discussed on the base of differential current-voltage characteristics.
© The Authors, published by EDP Sciences, 2017
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