https://doi.org/10.1051/epjconf/201715703043
CNES – Chalmers – IAP – ONERA - XLIM activities in the domain of high RF power breakdown phenomena
a CNES (France), 18 Avenue Edouard Belin, 31401 Toulouse, Cédex 9, France
b XLIM (France), 123 Avenue Albert Thomas, 87060 Limoges Cedex, France
c IAP (Russia), 46 Ulyanov St., Nizhny Novgorod, 603950, Russia
d Chalmers (Sweden), Chalmers University of Technology, SE-412 96 Göteborg, Sweden
e ONERA (France), BP74025 – 2 Avenue Edouard Belin, 31055 toulouse, Cédex 4, France
f CEA, IRFM, F-13108 Saint Paul-lez-Durance, France
Published online: 23 October 2017
Multipactor breakdown is an important potential failure mechanism in many different microwave devices working under close to vacuum conditions. Applications range from space borne RF equipment to high-power microwave generators. The basic physics involved in the multipactor phenomenon is well known for the case of two infinite pallel plates made of metal. However, most realistic RF device geometries involve inhomogeneous RF electric fields and curved field lines and sometimes also dielectric material. The purpose of this paper is to set up methodologies to determine the Multipactor threshold in such situations.
© The authors, published by EDP Sciences, 2017
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
