EPJ Web of Conferences 161, 03003 (2017)
https://doi.org/10.1051/epjconf/201716103003
https://doi.org/10.1051/epjconf/201716103003
Data processing approaches in adopting single point–like emitter spectromicroscopy for mapping material characteristics of solid media
1
Institute for Spectroscopy RAS, 108840, Troitsk, Moscow, Russia
2
Moscow State Pedagogical University, 119991 Moscow Russia
* Corresponding author: golovanova@isan.troitsk.ru
Published online: 31 October 2017
We report an algorithm for building topogram of dielectric properties of a thin film by data of spectromicroscopy of single emitters.
© The Authors, published by EDP Sciences, 2017
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited. (http://creativecommons.org/licenses/by/4.0/).
