Data processing approaches in adopting single point–like emitter spectromicroscopy for mapping material characteristics of solid media
Institute for Spectroscopy RAS, 108840, Troitsk, Moscow, Russia
2 Moscow State Pedagogical University, 119991 Moscow Russia
* Corresponding author: firstname.lastname@example.org
Published online: 31 October 2017
We report an algorithm for building topogram of dielectric properties of a thin film by data of spectromicroscopy of single emitters.
© The Authors, published by EDP Sciences, 2017
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