Non-equilibrium critical behavior of Heisenberg thin films
Siberian federal university, 79 Svobodny Av., Krasnoyarsk, 660041, Russia
2 Omsk State University, Mira prospekt 55-A, Omsk, 644077, Russia
Published online: 4 July 2018
In this work we study the non-equilibrium properties of Heisenberg ferromagnetic films using Monte Carlo simulations by short-time dynamic method. By exploring the short-time scaling dynamics, we have found thickness dependency of critical exponents z, θ′ and β/v for ferromagnetic thin film. For calculating the critical exponents of ferromagnetic films we considered systems with linear size L = 128 and layers number N = 2; 4; 6; 10. Starting from initial configurations, the system was updated with Metropolis algorithm at the critical temperatures
© The Authors, published by EDP Sciences, 2018
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