https://doi.org/10.1051/epjconf/201920501022
Spectrally resolved wavefront characterization of broadband ultrafast high-harmonic pulses
1 Advanced Research Center for Nanolithography, Science Park 110, 1098 XG Amsterdam, The Netherlands
2 Department of Physics and Astronomy, and Laserlab, Vrije Universiteit, De Boelelaan 1081 HV Amsterdam, The Netherlands
* Corresponding author: witte@arcnl.nl
Published online: 16 April 2019
We demonstrate a sensor that measures wavefronts of multiple extreme ultraviolet wavelengths simultaneously. By incorporating transmission gratings into the apertures of a Hartmann mask, we can record wavefront information for series of discrete harmonics from a high-harmonic generation source in a single camera exposure, without the need for scanning parts. Wavefronts of up to nine high harmonics at 25-49 nm wavelength are retrieved, and ultrafast spatiotemporal couplings can be detected.
© The Authors, published by EDP Sciences, 2019
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
