https://doi.org/10.1051/epjconf/201920502006
Single shot XUV nanoimaging using an intense femtosecond soft X-ray laser
1 Institute of Optics and Quantum Electronics, Abbe Center of Photonics, Jena University, 07743 Jena, Germany
2 Helmholtz Institute Jena, 07743 Jena, Germany
3 Department of Chemistry, University of California, Berkeley, CA 94720, USA
4 LOA, ENSTA, CNRS, Ecole Polytechnique, Université Paris-Saclay, F-91762 Palaiseau cedex, France
5 Ludwig-Maxmrilians-Universität München, Am Coulombwall 1, 85748, Garching, Germany
6 Max-Planck-Institut fur Quantenoptik, Hans-Kopfermann-Str. 1, 85748, Garching, Germany
Published online: 16 April 2019
We report the direct wavefront characterization of an intense ultrafast high-harmonic-seeded soft X-ray laser (λ=32.8 nm) depending on the arrival time of the seed pulses by high-resolution ptychographic imaging and subsequently perform single-shot nanoscale imaging.
© The Authors, published by EDP Sciences, 2019
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
