Frustrated double ionization of argon atoms in strong laser fields
Photonics Institute, Technische Universitat Wien, A-1040 Vienna, Austria
1 Corresponding author: email@example.com
Published online: 16 April 2019
We report coincidence measurements of frustrated double ionization of argon atoms with a reaction microscope. Experimental results show electron trap- ping process during double ionization has a clear transition from the nonsequential to the sequential regime.
© The Authors, published by EDP Sciences, 2019
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