https://doi.org/10.1051/epjconf/202226602002
Computation of aberration coefficients for plane-symmetric reflective optical systems using Lie algebraic methods
1 Eindhoven University of Technology, PO Box 513, 5600 MB Eindhoven, The Netherlands
2 Signify, High Tech Campus 7, 5656 AE Eindhoven, The Netherlands
* e-mail: a.barion@tue.nl
Published online: 13 October 2022
The Lie algebraic method offers a systematic way to find aberration coefficients of any order for plane-symmetric reflective optical systems. The coefficients derived from the Lie method are in closed form and solely depend on the geometry of the optical system. We investigate and verify the results for a single reflector. The concatenation of multiple mirrors follows from the mathematical framework.
© The Authors, published by EDP Sciences
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