https://doi.org/10.1051/epjconf/202328810015
Investigating the Thickness-Dependent Scintillator-PMT Interface Reflection Coefficients with GAGG:Ce3+ Crystals Using the Dual-PMT Setup
Ken and Mary Alice Lindquist Department of Nuclear Engineering The Pennsylvania State University
Published online: 21 November 2023
Recently, it has been shown through both Monte Carlo simulations and experiments that scintillator-PMT interface reflection coefficients could depend on crystal thickness. It has been argued that the thickness-dependency on the interface reflection coefficient is a result of bulk attenuation and surface reflections. So far, only LYSO:Ce3+ scintillators have been tested to investigate thickness-dependent reflection coefficients. In this work, the simulations and experiments are extended to GAGG:Ce3+ crystals. Moreover, a new experimental technique (the dualPMT setup) has been tested to measure the interface reflection coefficients, and it has been shown through the dual-PMT setup that GAGG:Ce3+-PMT interface reflection coefficients are thickness-dependent with more than 1σ confidence. These results are also supported with extensive Monte Carlo simulations.
Key words: Scintillators / Geant4 simulations / reflection coefficients / light yield
© The Authors, published by EDP Sciences, 2023
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
