https://doi.org/10.1051/epjconf/202430910005
Mode Coupling and Sensing in Plasmonic Layered Structures
1 Optics & Photonics Center, MAScIR-University Mohammed VI Polytechnic, Ben Guerir, Morocco
2 Department of Chemistry, Faculty of Sciences, University Mohammed V in Rabat, Rabat, Morocco
* Corresponding author: author@e-mail.org
Published online: 31 October 2024
Optical sensors based on a plasmonic multilayer stack, such as metal-insulator-metal (MIM), have attracted considerable attention over the past decades owing to their high resolution and high performance compared to conventional surface plasmon resonance (CSPR) sensors for bulk sensing (BS) applications. In this paper we show that CSPR is better than MIM sensors for thin film sensing, i.e. when a dielectric sensing layer (SL) is deposited on the outermost metal layer of the structure. We demonstrate that the deposition of a thin film SL on the top of the outermost-layer of an optimized multilayer structure, i.e. MIM, strongly decreases the evanescent electric field and the field enhancement at metal-SL interface and decreases the sensor’s sensitivity for MIM versus CSPR. By considering the theoretical and experimental results we demontrated that CSPR is more suitable than MIM for thin films sensing applications.
© The Authors, published by EDP Sciences, 2024
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 4.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
