https://doi.org/10.1051/epjconf/20100626001
Lab-on-chips based testing methods to investigate the mechanical behaviour of thin films
1
MEMS Instruments, 1348
Louvain-la-Neuve,
Belgium
2
Electrical Engineering, Université catholique de
Louvain, 1348
Louvain-la-Neuve,
Belgium
3
Institute of Mechanics, Materials and Civil engineering,
Université catholique de Louvain, 1348
Louvain-la-Neuve,
Belgium
This article has no abstract.
© Owned by the authors, published by EDP Sciences, 2010
