https://doi.org/10.1051/epjconf/20134112001
Frequency-resolved optical gating with electro-optic sampling
1 Institute for Molecular Science, 38 Nishigonaka, Myodaiji, Okazaki 444-8585, Japan
2 Faculty of Engineering, Kagawa University, 2217-20 Hayashi-cho, Takamatsu, 761-0396, Japan
a e-mail: fuji@ims.ac.jp
We have demonstrated a new pulse characterization technique, cross-correlation frequency-resolved optical gating with electro-optic sampling. Sub-single-cycle mid-infrared pulses were characterized with the absolute carrier-envelope phase values by using the method.
© Owned by the authors, published by EDP Sciences, 2013
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