https://doi.org/10.1051/epjconf/20134112002
Self-referenced spectral interferometry for ultra-short infrared pulse characterization
1 Paul Scherrer Institute, SwissFEL, 5232 Villigen PSI, Switzerland
2 Fastlite, Centre Scientifique d’Orsay, Bat 503, Plateau du Moulon, BP45, 91401 Orsay, France
3 Ecole Polytechnique Federale de Lausanne, 1015 Lausanne, Switzerland
Self-Referenced Spectral Interferometry is used for single shot pulse characterization over the 0.9-2.5 µm spectral range with a single spectrometer and an optimized optical setup. We characterize sub-55 fs pulses from 1.4 µm to 2 µm and broadband 2.5-cycle pulses at 1.65 µm (13 fs FWHM).
© Owned by the authors, published by EDP Sciences, 2013
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