https://doi.org/10.1051/epjconf/20147505013
Stresses evolution at high temperature (200°C) on the interface of thin films in magnetic components
1 Laboratoire Telecom Claude Chappe, Université Jean-Monnet, Saint-Etienne, France
2 Laboratoire des Dispositifs micro-ondes et Radiofréquences, Université Libanaise, Beirut, Lebanon
3 IUT, Université Jean-Monnet, Saint-Etienne, France
Published online: 3 July 2014
In the field of electronics, the increase of operating temperatures is a major industrial and scientific challenge because it allows reducing mass and volume of components especially in the aeronautic domain. So minimizing our components reduce masses and the use of cooling systems. For that, the behaviours and interface stresses of our components (in particular magnetic inductors and transformers) that are constituted of one magnetic layer (YIG) or an alumina substrate (Al2O3) representing the substrate and a thin copper film are studied at high temperature (200°C). COMSOL Multiphysics is used to simulate our work and to validate our measurements results. In this paper, we will present stresses results according to the geometrical copper parameters necessary for the component fabrication. Results show that stresses increase with temperature and copper’s thickness while remaining always lower than 200MPa which is the rupture stress value.
© Owned by the authors, published by EDP Sciences, 2014
This is an Open Access article distributed under the terms of the Creative Commons Attribution License 2.0, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
