EPJ Plus Highlight – Statistical uncertainty in line shift and width interpretation

A general statistical analysis (classical statistics) is a common experimental procedure to determine the uncertainty of photon statistics in measuring a line shift and width. Given the importance of taking into account the background as well as the measured signal in any photon measurement, the paper describes both the perfect spectrometer measurements with a zero and nonzero background as well as the case of an imperfect spectrometer.

More complex line shapes are reviewed and the problems of their evaluation are discussed. The paper then addresses all situations when, instead of making continuous measurements, modern detection arrays with finite-width wavelength bins (pixels) are employed. By providing detailed mathematical descriptions for the line width and shapes discussed with either zero or nonzero background subtraction, this work will be of considerable use for many researchers in assessing their experimentally obtained results.

Statistical uncertainty in line shift and width interpretation. I. H. Hutchinson, Eur. Phys. J. Plus (2012), 127: 81 DOI: 10.1140/epjp/i2012-12081-3

This was our first experience of publishing with EPJ Web of Conferences. We contacted the publisher in the middle of September, just one month prior to the Conference, but everything went through smoothly. We have had published MNPS Proceedings with different publishers in the past, and would like to tell that the EPJ Web of Conferences team was probably the best, very quick, helpful and interactive. Typically, we were getting responses from EPJ Web of Conferences team within less than an hour and have had help at every production stage.
We are very thankful to Solange Guenot, Web of Conferences Publishing Editor, and Isabelle Houlbert, Web of Conferences Production Editor, for their support. These ladies are top-level professionals, who made a great contribution to the success of this issue. We are fully satisfied with the publication of the Conference Proceedings and are looking forward to further cooperation. The publication was very fast, easy and of high quality. My colleagues and I strongly recommend EPJ Web of Conferences to anyone, who is interested in quick high-quality publication of conference proceedings.

On behalf of the Organizing and Program Committees and Editorial Team of MNPS-2019, Dr. Alexey B. Nadykto, Moscow State Technological University “STANKIN”, Moscow, Russia. EPJ Web of Conferences vol. 224 (2019)

ISSN: 2100-014X (Electronic Edition)

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